The contact problem of an Euler-Bernoulli nanobeam of finite length bonded to a homogeneous elastic half plane is studied in the\npresent work. Both the beam and the half plane are assumed to display a linear elastic behaviour under infinitesimal strains. The\nanalysis is performed under plane strain condition.Owing to the bending stiffness of the beam, shear and peeling stresses arise at the\ninterface between the beam and the substrate within the contact region.The investigation allows evaluating the role played by the\nPoisson ratio of the half plane (and, in turn, its compressibility) on the beam-substrate mechanical interaction. Different symmetric\nand skew-symmetric loading conditions for the beam are considered, with particular emphasis to concentrated transversal and\nhorizontal forces and couples acting at its edges. It is found that the Poisson ratio of the half plane affects the behaviour of the\ninterfacial stress field, particularly at the beam edges, where the shear and peel stresses are singular.
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